Books Edited:
1. "Scanning Probe Microscopy of Electrical and Electromechanical Phenomena at the Nanoscale", edited by S.V.Kalinin and A.Gruverman (Springer, 2006).
2. "Ferroelectrics at Nanoscale: Scanning Probe Microscopy Approach", edited by M.Alexe and A.Gruverman (Springer, 2004).
Book Chapters and Review Papers:
3. A.Gruverman and A.Kholkin, “Nanoscale Ferroelectrics: Processing, Characterization and Future Trends”, Rep. Prog. Phys. 69, 2443-2474 (2006).
4. A.Gruverman, "Ferroelectric Nanodomains", in Encyclopedia of Nanoscience and Nanotechnology, edited by H. S. Nalwa (American Scientific Publishers, Los Angeles, 2004), Vol. 3, pp.359-375.
5. A.Gruverman, O.Auciello and H.Tokumoto, "Imaging and Control of Domain Structures in Ferroelectric Thin Films via Scanning Force Microscopy", Ann. Rev. of Mat. Science 28, 101-124 (1998).
Papers in International Journals:
6. A.Gruverman, D.Wu, and J.F.Scott, “Piezoresponse Force Microscopy Studies of Switching Behavior of Ferroelectric Capacitors on a 100-ns Timescale”, Phys. Rev. Lett. 100, 097601-604 (2008).
7. J.N.Hanson, B.J.Rodriguez, R.J.Nemanich, and A.Gruverman, “Fabrication of Metallic Nanowires on a Ferroelectric Template via Photochemical Reaction”, Nanotechnology 17, 4946-4949 (2006).
8. B.J.Rodriguez, S.V.Kalinin, J.Shin, S.Jesse, V.Grichko, T.Thundat, A.P.Baddorf, and A.Gruverman, “Electromechanical Imaging of Biomaterials by Scanning Probe Microscopy”, J. Structural Biology 153, 151-159 (2006).
9. A.Gruverman, D. Wu, B.J.Rodriguez, S.V.Kalinin, and S.Habelitz, "Nanoscale Electromechanical Imaging of Proteins in Human Teeth", Biochemical and Biophysical Research Communications 352, 142-146 (2006).
10. S.V.Kalinin, B.J.Rodriguez, S.Jesse, J.Shin, A.P.Baddorf, P.Gupta, H. Jain, D.B.Williams, and A.Gruverman, “Vector Piezoresponse Force Microscopy”, Microscopy and Microanalysis 12, 206-220 (2006).
11. S.V.Kalinin, B.J.Rodriguez, S.Jesse, T.Thundat, and A.Gruverman, "Electromechanical Imaging of Biological Systems with sub-10 nm Resolution", Appl. Phys. Lett. 87, 053901-903 (2005).
12. J.Shin, B.J.Rodriguez, A.P.Baddorf, T.Thundat, E.Karapetian, M.Kachanov, A.Gruverman, and S.V.Kalinin, “Simultaneous Elastic and Electromechanical Imaging by Scanning Probe Microscopy: Theory and Applications to Ferroelectric and Biological Materials”, J. Vac. Sci. & Technol. B 23, 2102 (2005).
13. A.Gruverman, B.J.Rodriguez, C.Dehoff, J.D.Waldrep, A.I.Kingon, R.J.Nemanich, and J.S.Cross, "Direct Studies of Domain Switching Dynamics in Thin Film Ferroelectric Capacitors", Appl. Phys. Lett. 87, 082902 (2005).
14. B.J.Rodriguez, R J.Nemanich, A.Kingon, S.V.Kalinin, K.Terabe, X.Y.Liu, K. Kitamura and A.Gruverman, "Domain Growth Kinetics in Lithium Niobate Single Crystals Studied by Piezoresponse Force Microscopy", Appl. Phys Lett. 86, 012906 (2005).
15. C.Dehoff, B.J.Rodriguez, A.I.Kingon, R.J.Nemanich, A.Gruverman, and J.S.Cross, "AFM-Based Experimental Setup for Studying Domain Switching Dynamics in Ferroelectric Capacitors", Rev. Sci. Instrum. 76, 023708 (2005).
16. B.J.Rodriguez, A.Gruverman, A.I.Kingon, R.J Nemanich, J.S.Cross, "Investigation of the Mechanism of Polarization Switching in Ferroelectric Capacitors by Three-Dimensional Piezoresponse Force Microscopy", Applied Physics A80, 99-103 (2005).
17. A.Gruverman, W.Cao, S.Bhaskar, and S.K.Dey, "Investigation of Pb(Zr,Ti)O3/GaN Heterostructures by Scanning Probe Microscopy", Appl. Phys. Lett. 84, 5153-5155 (2004).
18. A.Gruverman, B.J.Rodriguez, R.J.Nemanich, A.I.Kingon, A.Tagantsev, J.S.Cross and M.Tsukada “Mechanical Stress Effect on Imprint Behavior of Integrated Ferroelectric Capacitors”, Appl. Phys. Lett. 83, 728-730 (2003).
19. A.Gruverman, B.J.Rodriguez, R.J.Nemanich, A.I.Kingon, J.S.Cross and M.Tsukada “Spatial Inhomogeneity of Imprint and Switching Behavior in Integrated Ferroelectric Capacitors”, Appl. Phys. Lett. 82, 3071-3073 (2003).
20. B.J.Rodriguez, A.Gruverman, A.I.Kingon, R.J.Nemanich and O.Ambacher, “Piezoresponse Force Microscopy for Polarity Imaging of GaN”, Appl. Phys. Lett. 80, 4166-4168 (2002).
21. A.Gruverman, A.Kholkin, A.Kingon and H.Tokumoto, “Asymmetric Nanoscale Switching in Ferroelectric Thin Films by Scanning Force Microscopy”, Appl. Phys. Lett. 78, 2751-2753 (2001).
22. A.Gruverman, K.Hironaka, Y.Ikeda, K.M.Satyalakshmi, A.Pignolet, M.Alexe, N.D.Zakharov and D.Hesse, “SFM Characterization of SrBi2Ta2O9 Thin Films for Nanoscale Memory Applications”, Integrated Ferroelectrics 27, 159-169 (1999).
23. A.Gruverman, “Scaling Effect on Statistical Behavior of Switching Parameters of Ferroelectric Capacitors”, Appl. Phys. Lett. 75, 1452-1454 (1999).
24. A.Gruverman and Y.Ikeda, "Characterization and Control of Domain Structure in SrBi2Ta2O9 Thin Films by Scanning Force Microscopy", Jpn. J. Appl. Phys. 37, Part 2, L939-L941 (1998).
25. A.Gruverman, O.Auciello and H.Tokumoto, "Scanning Force Microscopy: Application to Nanoscale Studies of Ferroelectric Domains", invited review, Integrated Ferroelectrics 19, 49-83 (1998).
26. A.Gruverman, H.Tokumoto, S.A.Prakash, S.Aggarwal, B.Yang, M.Wuttig, R. Ramesh, O. Auciello, and V.Venkatesan, "Nanoscale Imaging of Domain Dynamics and Retention in Ferroelectric Thin Films", Appl. Phys. Lett. 71, 3492-3494 (1997).
27. A.Gruverman, J.Hatano and H.Tokumoto, "Scanning Force Microscopy Studies of Domain Structure in BaTiO3 Single Crystals", Jpn. J. Appl. Phys., 36, Part 1, No 4, 2207-2211 (1997).
28. A.Gruverman, O.Auciello and H.Tokumoto, "Nanoscale Investigation of Fatigue Effects in Pb(Zr,Ti)O3 Films", Appl. Phys. Lett. 69, 3191-3193 (1996).
29. A.Gruverman, O.Auciello and H.Tokumoto, “Scanning Force Microscopy for the Study of Domain Structure in Ferroelectric Thin Films”, J. Vac. Sci. Technol. B14, 602-605 (1996).
30. A.Gruverman, N.Ponomarev and K.Takahashi, “Domain Nucleation During Polarization Reversal in Lead Germanate”, Jap. J. Appl. Phys., 33, Part 1, No 9B, 5536-5539 (1994).
